LLM-Powered Test Case Generation for Detecting Bugs in Plausible Programs

Kaibo Liu | Zhenpeng Chen | Yiyang Liu | Jie M. Zhang | Mark Harman | Yudong Han | Yun Ma | Yihong Dong | Ge Li | Gang Huang |

Paper Details:

Month: July
Year: 2025
Location: Vienna, Austria
Venue: ACL |