Gradations of Error Severity in Automatic Image Descriptions

Emiel van Miltenburg | Wei-Ting Lu | Emiel Krahmer | Albert Gatt | Guanyi Chen | Lin Li | Kees van Deemter |

Paper Details:

Month: December
Year: 2020
Location: Dublin, Ireland
Venue: INLG |
SIG: SIGGEN

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